/**
* Licensed to the Apache Software Foundation (ASF) under one
* or more contributor license agreements. See the NOTICE file
* distributed with this work for additional information
* regarding copyright ownership. The ASF licenses this file
* to you under the Apache License, Version 2.0 (the
* "License"); you may not use this file except in compliance
* with the License. You may obtain a copy of the License at
*
* http://www.apache.org/licenses/LICENSE-2.0
*
* Unless required by applicable law or agreed to in writing, software
* distributed under the License is distributed on an "AS IS" BASIS,
* WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
* See the License for the specific language governing permissions and
* limitations under the License.
*/
package org.apache.hadoop.hive.serde2.lazybinary;
import java.sql.Date;
import java.util.ArrayList;
import java.util.Arrays;
import java.util.HashMap;
import java.util.LinkedHashMap;
import java.util.List;
import java.util.Map;
import java.util.Properties;
import java.util.Random;
import junit.framework.TestCase;
import org.apache.hadoop.conf.Configuration;
import org.apache.hadoop.hive.common.type.HiveDecimal;
import org.apache.hadoop.hive.serde.serdeConstants;
import org.apache.hadoop.hive.serde2.SerDe;
import org.apache.hadoop.hive.serde2.SerDeUtils;
import org.apache.hadoop.hive.serde2.binarysortable.MyTestClass;
import org.apache.hadoop.hive.serde2.binarysortable.MyTestInnerStruct;
import org.apache.hadoop.hive.serde2.binarysortable.TestBinarySortableSerDe;
import org.apache.hadoop.hive.serde2.lazy.ByteArrayRef;
import org.apache.hadoop.hive.serde2.lazy.LazyBinary;
import org.apache.hadoop.hive.serde2.lazy.LazyFactory;
import org.apache.hadoop.hive.serde2.lazy.objectinspector.primitive.AbstractPrimitiveLazyObjectInspector;
import org.apache.hadoop.hive.serde2.lazy.objectinspector.primitive.LazyPrimitiveObjectInspectorFactory;
import org.apache.hadoop.hive.serde2.lazybinary.objectinspector.LazyBinaryMapObjectInspector;
import org.apache.hadoop.hive.serde2.objectinspector.MapObjectInspector;
import org.apache.hadoop.hive.serde2.objectinspector.ObjectInspector;
import org.apache.hadoop.hive.serde2.objectinspector.ObjectInspectorFactory;
import org.apache.hadoop.hive.serde2.objectinspector.ObjectInspectorFactory.ObjectInspectorOptions;
import org.apache.hadoop.hive.serde2.objectinspector.ObjectInspectorUtils;
import org.apache.hadoop.hive.serde2.objectinspector.PrimitiveObjectInspector.PrimitiveCategory;
import org.apache.hadoop.hive.serde2.objectinspector.StructField;
import org.apache.hadoop.hive.serde2.objectinspector.StructObjectInspector;
import org.apache.hadoop.hive.serde2.objectinspector.primitive.JavaBinaryObjectInspector;
import org.apache.hadoop.hive.serde2.objectinspector.primitive.PrimitiveObjectInspectorFactory;
import org.apache.hadoop.hive.serde2.objectinspector.primitive.WritableBinaryObjectInspector;
import org.apache.hadoop.hive.serde2.typeinfo.TypeInfoFactory;
import org.apache.hadoop.io.BytesWritable;
/**
* TestLazyBinarySerDe.
*
*/
public class TestLazyBinarySerDe extends TestCase {
/**
* Generate a random struct array.
*
* @param r
* random number generator
* @return an struct array
*/
static List<MyTestInnerStruct> getRandStructArray(Random r) {
int length = r.nextInt(10);
ArrayList<MyTestInnerStruct> result = new ArrayList<MyTestInnerStruct>(
length);
for (int i = 0; i < length; i++) {
MyTestInnerStruct ti = new MyTestInnerStruct(r.nextInt(), r.nextInt());
result.add(ti);
}
return result;
}
/**
* Initialize the LazyBinarySerDe.
*
* @param fieldNames
* table field names
* @param fieldTypes
* table field types
* @return the initialized LazyBinarySerDe
* @throws Throwable
*/
private SerDe getSerDe(String fieldNames, String fieldTypes) throws Throwable {
Properties schema = new Properties();
schema.setProperty(serdeConstants.LIST_COLUMNS, fieldNames);
schema.setProperty(serdeConstants.LIST_COLUMN_TYPES, fieldTypes);
LazyBinarySerDe serde = new LazyBinarySerDe();
serde.initialize(new Configuration(), schema);
return serde;
}
/**
* Test the LazyBinarySerDe.
*
* @param rows
* array of structs to be serialized
* @param rowOI
* array of struct object inspectors
* @param serde
* the serde
* @throws Throwable
*/
private void testLazyBinarySerDe(Object[] rows, ObjectInspector rowOI,
SerDe serde) throws Throwable {
ObjectInspector serdeOI = serde.getObjectInspector();
// Try to serialize
BytesWritable bytes[] = new BytesWritable[rows.length];
for (int i = 0; i < rows.length; i++) {
BytesWritable s = (BytesWritable) serde.serialize(rows[i], rowOI);
bytes[i] = new BytesWritable();
bytes[i].set(s);
}
// Try to deserialize
Object[] deserialized = new Object[rows.length];
for (int i = 0; i < rows.length; i++) {
deserialized[i] = serde.deserialize(bytes[i]);
if (0 != ObjectInspectorUtils.compare(rows[i], rowOI, deserialized[i],
serdeOI)) {
System.out.println("structs[" + i + "] = "
+ SerDeUtils.getJSONString(rows[i], rowOI));
System.out.println("deserialized[" + i + "] = "
+ SerDeUtils.getJSONString(deserialized[i], serdeOI));
System.out.println("serialized[" + i + "] = "
+ TestBinarySortableSerDe.hexString(bytes[i]));
assertEquals(rows[i], deserialized[i]);
}
}
}
/**
* Compare two structs that have different number of fields. We just compare
* the first few common fields, ignoring the fields existing in one struct but
* not the other.
*
* @see ObjectInspectorUtils#compare(Object, ObjectInspector, Object,
* ObjectInspector)
*/
int compareDiffSizedStructs(Object o1, ObjectInspector oi1, Object o2,
ObjectInspector oi2) {
StructObjectInspector soi1 = (StructObjectInspector) oi1;
StructObjectInspector soi2 = (StructObjectInspector) oi2;
List<? extends StructField> fields1 = soi1.getAllStructFieldRefs();
List<? extends StructField> fields2 = soi2.getAllStructFieldRefs();
int minimum = Math.min(fields1.size(), fields2.size());
for (int i = 0; i < minimum; i++) {
int result = ObjectInspectorUtils.compare(soi1.getStructFieldData(o1,
fields1.get(i)), fields1.get(i).getFieldObjectInspector(), soi2
.getStructFieldData(o2, fields2.get(i)), fields2.get(i)
.getFieldObjectInspector());
if (result != 0) {
return result;
}
}
return 0;
}
/**
* Test shorter schema deserialization where a bigger struct is serialized and
* it is then deserialized with a smaller struct. Here the serialized struct
* has 10 fields and we deserialized to a struct of 9 fields.
*/
private void testShorterSchemaDeserialization(Random r) throws Throwable {
StructObjectInspector rowOI1 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClassBigger.class,
ObjectInspectorOptions.JAVA);
String fieldNames1 = ObjectInspectorUtils.getFieldNames(rowOI1);
String fieldTypes1 = ObjectInspectorUtils.getFieldTypes(rowOI1);
SerDe serde1 = getSerDe(fieldNames1, fieldTypes1);
serde1.getObjectInspector();
StructObjectInspector rowOI2 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClass.class,
ObjectInspectorOptions.JAVA);
String fieldNames2 = ObjectInspectorUtils.getFieldNames(rowOI2);
String fieldTypes2 = ObjectInspectorUtils.getFieldTypes(rowOI2);
SerDe serde2 = getSerDe(fieldNames2, fieldTypes2);
ObjectInspector serdeOI2 = serde2.getObjectInspector();
int num = 100;
for (int itest = 0; itest < num; itest++) {
int randField = r.nextInt(11);
Byte b = randField > 0 ? null : Byte.valueOf((byte) r.nextInt());
Short s = randField > 1 ? null : Short.valueOf((short) r.nextInt());
Integer n = randField > 2 ? null : Integer.valueOf(r.nextInt());
Long l = randField > 3 ? null : Long.valueOf(r.nextLong());
Float f = randField > 4 ? null : Float.valueOf(r.nextFloat());
Double d = randField > 5 ? null : Double.valueOf(r.nextDouble());
String st = randField > 6 ? null : TestBinarySortableSerDe
.getRandString(r);
HiveDecimal bd = randField > 7 ? null : TestBinarySortableSerDe.getRandHiveDecimal(r);
Date date = randField > 8 ? null : TestBinarySortableSerDe.getRandDate(r);
MyTestInnerStruct is = randField > 9 ? null : new MyTestInnerStruct(r
.nextInt(5) - 2, r.nextInt(5) - 2);
List<Integer> li = randField > 10 ? null : TestBinarySortableSerDe
.getRandIntegerArray(r);
byte[] ba = TestBinarySortableSerDe.getRandBA(r, itest);
Map<String, List<MyTestInnerStruct>> mp = new HashMap<String, List<MyTestInnerStruct>>();
String key = TestBinarySortableSerDe.getRandString(r);
List<MyTestInnerStruct> value = randField > 9 ? null
: getRandStructArray(r);
mp.put(key, value);
String key1 = TestBinarySortableSerDe.getRandString(r);
mp.put(key1, null);
String key2 = TestBinarySortableSerDe.getRandString(r);
List<MyTestInnerStruct> value2 = getRandStructArray(r);
mp.put(key2, value2);
MyTestClassBigger input = new MyTestClassBigger(b, s, n, l, f, d, st, bd, date, is,
li, ba, mp);
BytesWritable bw = (BytesWritable) serde1.serialize(input, rowOI1);
Object output = serde2.deserialize(bw);
if (0 != compareDiffSizedStructs(input, rowOI1, output, serdeOI2)) {
System.out.println("structs = "
+ SerDeUtils.getJSONString(input, rowOI1));
System.out.println("deserialized = "
+ SerDeUtils.getJSONString(output, serdeOI2));
System.out.println("serialized = "
+ TestBinarySortableSerDe.hexString(bw));
assertEquals(input, output);
}
}
}
/**
* Test shorter schema deserialization where a bigger struct is serialized and
* it is then deserialized with a smaller struct. Here the serialized struct
* has 9 fields and we deserialized to a struct of 8 fields.
*/
private void testShorterSchemaDeserialization1(Random r) throws Throwable {
StructObjectInspector rowOI1 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClass.class,
ObjectInspectorOptions.JAVA);
String fieldNames1 = ObjectInspectorUtils.getFieldNames(rowOI1);
String fieldTypes1 = ObjectInspectorUtils.getFieldTypes(rowOI1);
SerDe serde1 = getSerDe(fieldNames1, fieldTypes1);
serde1.getObjectInspector();
StructObjectInspector rowOI2 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClassSmaller.class,
ObjectInspectorOptions.JAVA);
String fieldNames2 = ObjectInspectorUtils.getFieldNames(rowOI2);
String fieldTypes2 = ObjectInspectorUtils.getFieldTypes(rowOI2);
SerDe serde2 = getSerDe(fieldNames2, fieldTypes2);
ObjectInspector serdeOI2 = serde2.getObjectInspector();
int num = 100;
for (int itest = 0; itest < num; itest++) {
int randField = r.nextInt(12);
Byte b = randField > 0 ? null : Byte.valueOf((byte) r.nextInt());
Short s = randField > 1 ? null : Short.valueOf((short) r.nextInt());
Integer n = randField > 2 ? null : Integer.valueOf(r.nextInt());
Long l = randField > 3 ? null : Long.valueOf(r.nextLong());
Float f = randField > 4 ? null : Float.valueOf(r.nextFloat());
Double d = randField > 5 ? null : Double.valueOf(r.nextDouble());
String st = randField > 6 ? null : TestBinarySortableSerDe
.getRandString(r);
HiveDecimal bd = randField > 7 ? null : TestBinarySortableSerDe.getRandHiveDecimal(r);
Date date = randField > 8 ? null : TestBinarySortableSerDe.getRandDate(r);
MyTestInnerStruct is = randField > 9 ? null : new MyTestInnerStruct(r
.nextInt(5) - 2, r.nextInt(5) - 2);
List<Integer> li = randField > 10 ? null : TestBinarySortableSerDe
.getRandIntegerArray(r);
byte[] ba = TestBinarySortableSerDe.getRandBA(r, itest);
MyTestClass input = new MyTestClass(b, s, n, l, f, d, st, bd, date, is, li, ba);
BytesWritable bw = (BytesWritable) serde1.serialize(input, rowOI1);
Object output = serde2.deserialize(bw);
if (0 != compareDiffSizedStructs(input, rowOI1, output, serdeOI2)) {
System.out.println("structs = "
+ SerDeUtils.getJSONString(input, rowOI1));
System.out.println("deserialized = "
+ SerDeUtils.getJSONString(output, serdeOI2));
System.out.println("serialized = "
+ TestBinarySortableSerDe.hexString(bw));
assertEquals(input, output);
}
}
}
/**
* Test longer schema deserialization where a smaller struct is serialized and
* it is then deserialized with a bigger struct Here the serialized struct has
* 9 fields and we deserialized to a struct of 10 fields.
*/
void testLongerSchemaDeserialization(Random r) throws Throwable {
StructObjectInspector rowOI1 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClass.class,
ObjectInspectorOptions.JAVA);
String fieldNames1 = ObjectInspectorUtils.getFieldNames(rowOI1);
String fieldTypes1 = ObjectInspectorUtils.getFieldTypes(rowOI1);
SerDe serde1 = getSerDe(fieldNames1, fieldTypes1);
serde1.getObjectInspector();
StructObjectInspector rowOI2 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClassBigger.class,
ObjectInspectorOptions.JAVA);
String fieldNames2 = ObjectInspectorUtils.getFieldNames(rowOI2);
String fieldTypes2 = ObjectInspectorUtils.getFieldTypes(rowOI2);
SerDe serde2 = getSerDe(fieldNames2, fieldTypes2);
ObjectInspector serdeOI2 = serde2.getObjectInspector();
int num = 100;
for (int itest = 0; itest < num; itest++) {
int randField = r.nextInt(12);
Byte b = randField > 0 ? null : Byte.valueOf((byte) r.nextInt());
Short s = randField > 1 ? null : Short.valueOf((short) r.nextInt());
Integer n = randField > 2 ? null : Integer.valueOf(r.nextInt());
Long l = randField > 3 ? null : Long.valueOf(r.nextLong());
Float f = randField > 4 ? null : Float.valueOf(r.nextFloat());
Double d = randField > 5 ? null : Double.valueOf(r.nextDouble());
String st = randField > 6 ? null : TestBinarySortableSerDe
.getRandString(r);
HiveDecimal bd = randField > 7 ? null : TestBinarySortableSerDe.getRandHiveDecimal(r);
Date date = randField > 8 ? null : TestBinarySortableSerDe.getRandDate(r);
MyTestInnerStruct is = randField > 9 ? null : new MyTestInnerStruct(r
.nextInt(5) - 2, r.nextInt(5) - 2);
List<Integer> li = randField > 10 ? null : TestBinarySortableSerDe
.getRandIntegerArray(r);
byte[] ba = TestBinarySortableSerDe.getRandBA(r, itest);
MyTestClass input = new MyTestClass(b, s, n, l, f, d, st, bd, date, is, li,ba);
BytesWritable bw = (BytesWritable) serde1.serialize(input, rowOI1);
Object output = serde2.deserialize(bw);
if (0 != compareDiffSizedStructs(input, rowOI1, output, serdeOI2)) {
System.out.println("structs = "
+ SerDeUtils.getJSONString(input, rowOI1));
System.out.println("deserialized = "
+ SerDeUtils.getJSONString(output, serdeOI2));
System.out.println("serialized = "
+ TestBinarySortableSerDe.hexString(bw));
assertEquals(input, output);
}
}
}
/**
* Test longer schema deserialization where a smaller struct is serialized and
* it is then deserialized with a bigger struct Here the serialized struct has
* 8 fields and we deserialized to a struct of 9 fields.
*/
void testLongerSchemaDeserialization1(Random r) throws Throwable {
StructObjectInspector rowOI1 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClassSmaller.class,
ObjectInspectorOptions.JAVA);
String fieldNames1 = ObjectInspectorUtils.getFieldNames(rowOI1);
String fieldTypes1 = ObjectInspectorUtils.getFieldTypes(rowOI1);
SerDe serde1 = getSerDe(fieldNames1, fieldTypes1);
serde1.getObjectInspector();
StructObjectInspector rowOI2 = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClass.class,
ObjectInspectorOptions.JAVA);
String fieldNames2 = ObjectInspectorUtils.getFieldNames(rowOI2);
String fieldTypes2 = ObjectInspectorUtils.getFieldTypes(rowOI2);
SerDe serde2 = getSerDe(fieldNames2, fieldTypes2);
ObjectInspector serdeOI2 = serde2.getObjectInspector();
int num = 100;
for (int itest = 0; itest < num; itest++) {
int randField = r.nextInt(9);
Byte b = randField > 0 ? null : Byte.valueOf((byte) r.nextInt());
Short s = randField > 1 ? null : Short.valueOf((short) r.nextInt());
Integer n = randField > 2 ? null : Integer.valueOf(r.nextInt());
Long l = randField > 3 ? null : Long.valueOf(r.nextLong());
Float f = randField > 4 ? null : Float.valueOf(r.nextFloat());
Double d = randField > 5 ? null : Double.valueOf(r.nextDouble());
String st = randField > 6 ? null : TestBinarySortableSerDe
.getRandString(r);
HiveDecimal bd = randField > 7 ? null : TestBinarySortableSerDe.getRandHiveDecimal(r);
Date date = randField > 7 ? null : TestBinarySortableSerDe.getRandDate(r);
MyTestInnerStruct is = randField > 7 ? null : new MyTestInnerStruct(r
.nextInt(5) - 2, r.nextInt(5) - 2);
MyTestClassSmaller input = new MyTestClassSmaller(b, s, n, l, f, d, st, bd, date,
is);
BytesWritable bw = (BytesWritable) serde1.serialize(input, rowOI1);
Object output = serde2.deserialize(bw);
if (0 != compareDiffSizedStructs(input, rowOI1, output, serdeOI2)) {
System.out.println("structs = "
+ SerDeUtils.getJSONString(input, rowOI1));
System.out.println("deserialized = "
+ SerDeUtils.getJSONString(output, serdeOI2));
System.out.println("serialized = "
+ TestBinarySortableSerDe.hexString(bw));
assertEquals(input, output);
}
}
}
void testLazyBinaryMap(Random r) throws Throwable {
StructObjectInspector rowOI = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClassBigger.class,
ObjectInspectorOptions.JAVA);
String fieldNames = ObjectInspectorUtils.getFieldNames(rowOI);
String fieldTypes = ObjectInspectorUtils.getFieldTypes(rowOI);
SerDe serde = getSerDe(fieldNames, fieldTypes);
ObjectInspector serdeOI = serde.getObjectInspector();
StructObjectInspector soi1 = (StructObjectInspector) serdeOI;
List<? extends StructField> fields1 = soi1.getAllStructFieldRefs();
LazyBinaryMapObjectInspector lazympoi = (LazyBinaryMapObjectInspector) fields1
.get(12).getFieldObjectInspector();
ObjectInspector lazympkeyoi = lazympoi.getMapKeyObjectInspector();
ObjectInspector lazympvalueoi = lazympoi.getMapValueObjectInspector();
StructObjectInspector soi2 = rowOI;
List<? extends StructField> fields2 = soi2.getAllStructFieldRefs();
MapObjectInspector inputmpoi = (MapObjectInspector) fields2.get(12)
.getFieldObjectInspector();
ObjectInspector inputmpkeyoi = inputmpoi.getMapKeyObjectInspector();
ObjectInspector inputmpvalueoi = inputmpoi.getMapValueObjectInspector();
int num = 100;
for (int testi = 0; testi < num; testi++) {
Map<String, List<MyTestInnerStruct>> mp = new LinkedHashMap<String, List<MyTestInnerStruct>>();
int randFields = r.nextInt(10);
for (int i = 0; i < randFields; i++) {
String key = TestBinarySortableSerDe.getRandString(r);
int randField = r.nextInt(10);
List<MyTestInnerStruct> value = randField > 4 ? null
: getRandStructArray(r);
mp.put(key, value);
}
MyTestClassBigger input = new MyTestClassBigger(null, null, null, null,
null, null, null, null, null, null, null, null, mp);
BytesWritable bw = (BytesWritable) serde.serialize(input, rowOI);
Object output = serde.deserialize(bw);
Object lazyobj = soi1.getStructFieldData(output, fields1.get(12));
Map<?, ?> outputmp = lazympoi.getMap(lazyobj);
if (outputmp.size() != mp.size()) {
throw new RuntimeException("Map size changed from " + mp.size()
+ " to " + outputmp.size() + " after serialization!");
}
for (Map.Entry<?, ?> entryinput : mp.entrySet()) {
boolean bEqual = false;
for (Map.Entry<?, ?> entryoutput : outputmp.entrySet()) {
// find the same key
if (0 == ObjectInspectorUtils.compare(entryoutput.getKey(),
lazympkeyoi, entryinput.getKey(), inputmpkeyoi)) {
if (0 != ObjectInspectorUtils.compare(entryoutput.getValue(),
lazympvalueoi, entryinput.getValue(), inputmpvalueoi)) {
assertEquals(entryoutput.getValue(), entryinput.getValue());
} else {
bEqual = true;
}
break;
}
}
if (!bEqual) {
throw new RuntimeException(
"Could not find matched key in deserialized map : "
+ entryinput.getKey());
}
}
}
}
/**
* The test entrance function.
*
* @throws Throwable
*/
public void testLazyBinarySerDe() throws Throwable {
try {
System.out.println("Beginning Test TestLazyBinarySerDe:");
// generate the data
int num = 1000;
Random r = new Random(1234);
MyTestClass rows[] = new MyTestClass[num];
for (int i = 0; i < num; i++) {
int randField = r.nextInt(12);
Byte b = randField > 0 ? null : Byte.valueOf((byte) r.nextInt());
Short s = randField > 1 ? null : Short.valueOf((short) r.nextInt());
Integer n = randField > 2 ? null : Integer.valueOf(r.nextInt());
Long l = randField > 3 ? null : Long.valueOf(r.nextLong());
Float f = randField > 4 ? null : Float.valueOf(r.nextFloat());
Double d = randField > 5 ? null : Double.valueOf(r.nextDouble());
String st = randField > 6 ? null : TestBinarySortableSerDe
.getRandString(r);
HiveDecimal bd = randField > 7 ? null : TestBinarySortableSerDe.getRandHiveDecimal(r);
Date date = randField > 8 ? null : TestBinarySortableSerDe.getRandDate(r);
MyTestInnerStruct is = randField > 9 ? null : new MyTestInnerStruct(r
.nextInt(5) - 2, r.nextInt(5) - 2);
List<Integer> li = randField > 10 ? null : TestBinarySortableSerDe
.getRandIntegerArray(r);
byte[] ba = TestBinarySortableSerDe.getRandBA(r, i);
MyTestClass t = new MyTestClass(b, s, n, l, f, d, st, bd, date, is, li, ba);
rows[i] = t;
}
StructObjectInspector rowOI = (StructObjectInspector) ObjectInspectorFactory
.getReflectionObjectInspector(MyTestClass.class,
ObjectInspectorOptions.JAVA);
String fieldNames = ObjectInspectorUtils.getFieldNames(rowOI);
String fieldTypes = ObjectInspectorUtils.getFieldTypes(rowOI);
// call the tests
// 1/ test LazyBinarySerDe
testLazyBinarySerDe(rows, rowOI, getSerDe(fieldNames, fieldTypes));
// 2/ test LazyBinaryMap
testLazyBinaryMap(r);
// 3/ test serialization and deserialization with different schemas
testShorterSchemaDeserialization(r);
// 4/ test serialization and deserialization with different schemas
testLongerSchemaDeserialization(r);
// 5/ test serialization and deserialization with different schemas
testShorterSchemaDeserialization1(r);
// 6/ test serialization and deserialization with different schemas
testLongerSchemaDeserialization1(r);
System.out.println("Test TestLazyBinarySerDe passed!");
} catch (Throwable e) {
e.printStackTrace();
throw e;
}
}
private final byte[] inpBArray = {'1','\u0001','3','4'};
private BytesWritable getInputBytesWritable() {
//create input BytesWritable. This would have capacity greater than length)
BytesWritable bW = new BytesWritable();
bW.set(inpBArray, 0, inpBArray.length);
return bW;
}
/**
* Test to see if byte[] with correct contents is generated by
* JavaBinaryObjectInspector from input BytesWritable
* @throws Throwable
*/
public void testJavaBinaryObjectInspector() throws Throwable {
BytesWritable bW = getInputBytesWritable();
//create JavaBinaryObjectInspector
JavaBinaryObjectInspector binInspector =
PrimitiveObjectInspectorFactory.javaByteArrayObjectInspector;
//convert BytesWritable to byte][
byte[] outBARef = binInspector.set(null, bW);
assertTrue("compare input and output BAs",
Arrays.equals(inpBArray, outBARef));
}
/**
* Test to see if byte[] with correct contents is generated by
* WritableBinaryObjectInspector from input BytesWritable
* @throws Throwable
*/
public void testWritableBinaryObjectInspector() throws Throwable {
BytesWritable bW = getInputBytesWritable();
//test WritableBinaryObjectInspector
WritableBinaryObjectInspector writableBinInsp =
PrimitiveObjectInspectorFactory.writableBinaryObjectInspector;
//convert BytesWritable to byte[]
byte[] outBARef = writableBinInsp.getPrimitiveJavaObject(bW);
assertTrue("compare input and output BAs",
Arrays.equals(inpBArray, outBARef));
}
/**
* Test to see if byte[] with correct contents is generated by
* LazyBinaryObjectInspector from input BytesWritable
* @throws Throwable
*/
public void testLazyBinaryObjectInspector() throws Throwable {
//create input ByteArrayRef
ByteArrayRef inpBARef = new ByteArrayRef();
inpBARef.setData(inpBArray);
AbstractPrimitiveLazyObjectInspector<?> binInspector = LazyPrimitiveObjectInspectorFactory
.getLazyObjectInspector(TypeInfoFactory.binaryTypeInfo, false, (byte)0);
//create LazyBinary initialed with inputBA
LazyBinary lazyBin = (LazyBinary) LazyFactory.createLazyObject(binInspector);
lazyBin.init(inpBARef, 0, inpBArray.length);
//use inspector to get a byte[] out of LazyBinary
byte[] outBARef = (byte[]) binInspector.getPrimitiveJavaObject(lazyBin);
assertTrue("compare input and output BAs",
Arrays.equals(inpBArray, outBARef));
}
}